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Experimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomography

dc.contributor.authorKumar, Arul
dc.contributor.authorDemeulemeester, Jelle
dc.contributor.authorBogdanowicz, Janusz
dc.contributor.authorBran, Julien
dc.contributor.authorMelkonyan, Davit
dc.date.accessioned2021-10-22T02:44:41Z
dc.date.available2021-10-22T02:44:41Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24080
dc.sourceIIOimport
dc.titleExperimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomography
dc.typeOral presentation
dc.contributor.imecauthorBogdanowicz, Janusz
dc.contributor.orcidimecBogdanowicz, Janusz::0000-0002-7503-8922
dc.source.peerreviewno
dc.source.conferenceAtom Probe Tomography and Microscopy
dc.source.conferencedate31/08/2014
dc.source.conferencelocationStuttgart Germany
imec.availabilityPublished - imec


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