dc.contributor.author | Lambrechts, Andy | |
dc.contributor.author | Jayapala, Murali | |
dc.contributor.author | Willems, Maarten | |
dc.date.accessioned | 2021-10-22T02:50:50Z | |
dc.date.available | 2021-10-22T02:50:50Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24100 | |
dc.source | IIOimport | |
dc.title | Snapshot Bayer pattern hyperspectral image sensor | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Lambrechts, Andy | |
dc.contributor.imecauthor | Jayapala, Murali | |
dc.contributor.imecauthor | Willems, Maarten | |
dc.contributor.orcidimec | Lambrechts, Andy::0000-0001-7592-2999 | |
dc.contributor.orcidimec | Jayapala, Murali::0000-0001-7917-0149 | |
dc.source.peerreview | no | |
dc.source.conference | TechConnect World Conference | |
dc.source.conferencedate | 16/06/2014 | |
dc.source.conferencelocation | Washington DC USA | |
imec.availability | Published - imec | |