Mn related defect levels in germanium

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Authors
Lauwaert, Johan; Moens, Filip; Segers, Siegfried; Opsomer, Karl; Simoen, Eddy; Vanhellemont, Jan; Clauws, Paul; Callens, Freddy; Vrielinck, Henk
Conference
226th ECS Fall Meeting - High Purity and High Mobility Semiconductors Symposium
Title
Mn related defect levels in germanium
Publication type
Proceedings paper
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