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CMOS scaling challenges for N14 down to N7

dc.contributor.authorLauwereins, Rudy
dc.date.accessioned2021-10-22T02:52:26Z
dc.date.available2021-10-22T02:52:26Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24105
dc.sourceIIOimport
dc.titleCMOS scaling challenges for N14 down to N7
dc.typeMeeting abstract
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.source.peerreviewno
dc.source.conferenceDesign Automation and Test in Europe Conference - DATE
dc.source.conferencedate25/03/2014
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - imec


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