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IEEE P1838: What is it and What is it not?

dc.contributor.authorMarinissen, Erik Jan
dc.date.accessioned2021-10-22T03:28:50Z
dc.date.available2021-10-22T03:28:50Z
dc.date.issued2014-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24201
dc.sourceIIOimport
dc.titleIEEE P1838: What is it and What is it not?
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewno
dc.source.beginpagena
dc.source.conferenceIEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits - 3D-TEST
dc.source.conferencedate23/10/2014
dc.source.conferencelocationSeattle, WA USA
dc.identifier.urlhttp://3dtest.tttc-events.org
imec.availabilityPublished - imec


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