Show simple item record

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorDe Wachter, Bart
dc.contributor.authorSmith, Ken
dc.contributor.authorKiesewetter, Joerg
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.date.accessioned2021-10-22T03:31:24Z
dc.date.available2021-10-22T03:31:24Z
dc.date.issued2014-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24208
dc.sourceIIOimport
dc.titleDirect probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface
dc.typeProceedings paper
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorDe Wachter, Bart
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage10
dc.source.conferenceIEEE International Test Conference - ITC
dc.source.conferencedate21/10/2014
dc.source.conferencelocationSeattle, WA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7035314
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record