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dc.contributor.authorMartens, Koen
dc.contributor.authorJeong, Jaewoo
dc.contributor.authorPhani, Aetukuri
dc.contributor.authorEsfahani, Davoud
dc.contributor.authorPeeters, Francois
dc.contributor.authorMoshchalkov, Victor
dc.contributor.authorVan de Vondel, Joris
dc.contributor.authorCharles, Rettner
dc.contributor.authorDouhard, Bastien
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorMahesh, Samant
dc.contributor.authorParkin, Stuart
dc.date.accessioned2021-10-22T03:33:56Z
dc.date.available2021-10-22T03:33:56Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24215
dc.sourceIIOimport
dc.titleElectric field-induced carrier accumulation at the vanadium dioxide - dielectric interface
dc.typeMeeting abstract
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorDouhard, Bastien
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.source.peerreviewno
dc.source.beginpageM47.4
dc.source.conferenceAPS March Meeting
dc.source.conferencedate3/03/2014
dc.source.conferencelocationDenver, CO USA
dc.identifier.urlhttp://meetings.aps.org/Meeting/MAR14/Session/M47.3
imec.availabilityPublished - imec
imec.internalnotesBulletin of the American Physical Society; Vol. 59, Iss. 1


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