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Interconnects scaling challenge for sub-20nm spin torque transfer magnetic random access memory technology

dc.contributor.authorMin, Tai
dc.contributor.authorTokei, Zsolt
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorCosemans, Stefan
dc.contributor.authorBekaert, Joost
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCornelissen, Sven
dc.contributor.authorXu, Kaidong
dc.contributor.authorSouriau, Laurent
dc.contributor.authorRadisic, Dunja
dc.contributor.authorSwerts, Johan
dc.contributor.authorTahmasebi, Taiebeh
dc.contributor.authorMertens, Sofie
dc.date.accessioned2021-10-22T03:48:58Z
dc.date.available2021-10-22T03:48:58Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24254
dc.sourceIIOimport
dc.titleInterconnects scaling challenge for sub-20nm spin torque transfer magnetic random access memory technology
dc.typeProceedings paper
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorBekaert, Joost
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorRadisic, Dunja
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorMertens, Sofie
dc.contributor.orcidimecBekaert, Joost::0000-0003-3075-3479
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage341
dc.source.endpage344
dc.source.conferenceIEEE International Interconnect Technology Conference / Advanced Metallization Conference - IITC/AMC
dc.source.conferencedate21/05/2014
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6831830
imec.availabilityPublished - open access


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