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Defect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study

dc.contributor.authorMinari, Hideki
dc.contributor.authorYoshida, Shinichi
dc.contributor.authorSawada, Ken
dc.contributor.authorNakazawa, Masashi
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorMerckling, Clement
dc.contributor.authorWaldron, Niamh
dc.contributor.authorGuo, Weiming
dc.contributor.authorJiang, Sijia
dc.contributor.authorCollaert, Nadine
dc.contributor.authorSimoen, Eddy
dc.contributor.authorLin, Dennis
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-10-22T03:49:26Z
dc.date.available2021-10-22T03:49:26Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24255
dc.sourceIIOimport
dc.titleDefect formation in III-V fin grown by aspect ratio trapping technique: a first-principles study
dc.typeProceedings paper
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpagePI.2
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861166&openedRefinements%3D*%26filter%3DAND(NOT(4283010803))%26p
imec.availabilityPublished - open access


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