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Comparative study of a fully differential op amp in FinFET and planar technologies

dc.contributor.authorMorrison, Sebastien
dc.contributor.authorParvais, Bertrand
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorMiyaguchi, Kenichi
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorWambacq, Piet
dc.date.accessioned2021-10-22T03:59:28Z
dc.date.available2021-10-22T03:59:28Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24280
dc.sourceIIOimport
dc.titleComparative study of a fully differential op amp in FinFET and planar technologies
dc.typeProceedings paper
dc.contributor.imecauthorMorrison, Sebastien
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorMiyaguchi, Kenichi
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorWambacq, Piet
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMiyaguchi, Kenichi::0000-0002-7073-6457
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conference10th Conference on Ph.D. Research in Microelectronics and Electronics - PRIME
dc.source.conferencedate30/06/2014
dc.source.conferencelocationGrenoble France
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6872667
imec.availabilityPublished - open access


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