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Degradation of Cu6Sn5 intermetallic compound by pore formation in solid-liquid interdiffusion Cu/Sn microbump interconnects
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Degradation of Cu6Sn5 intermetallic compound by pore formation in solid-liquid interdiffusion Cu/Sn microbump interconnects
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Panchenko, Iuliana
;
Croes, Kristof
;
De Wolf, Ingrid
;
De Messemaeker, Joke
;
Beyne, Eric
;
Wolter, Klaus-Juergen
Journal
Microelectronic Engineering
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1888
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Acq. date: 2026-01-08
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Metrics
Views
1888
since deposited on 2021-10-22
2
last month
Acq. date: 2026-01-08
Citations