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dc.contributor.authorPfeifer, P.
dc.contributor.authorKaczer, Ben
dc.contributor.authorPliva, Z.
dc.date.accessioned2021-10-22T04:43:27Z
dc.date.available2021-10-22T04:43:27Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24382
dc.sourceIIOimport
dc.titleA reliability lab-on-chip using programmable arrays
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpageCA.6
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2014.6861123
imec.availabilityPublished - imec


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