Publication:
Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs
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Acq. date: 2026-01-09
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Acq. date: 2026-01-09
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1 since deposited on 2021-10-22
Acq. date: 2026-01-09
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1913 since deposited on 2021-10-22
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Acq. date: 2026-01-09
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