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Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs

dc.contributor.authorProcel, Luis Miguel
dc.contributor.authorCrupi, Felice
dc.contributor.authorFranco, Jacopo
dc.contributor.authorTrojman, Lionel
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-22T04:51:08Z
dc.date.available2021-10-22T04:51:08Z
dc.date.issued2014
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24399
dc.sourceIIOimport
dc.titleDefect-centric distribution of channel hot carrier degradation in nano-MOSFETs
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1167
dc.source.endpage1169
dc.source.journalIEEE Electron Device Letters
dc.source.issue12
dc.source.volume35
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6930741
imec.availabilityPublished - open access


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