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Electrical evaluation of the EPI/substrate interface quality after different in-situ and ex-situ low-temperature pre-epi cleaning methods
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Electrical evaluation of the EPI/substrate interface quality after different in-situ and ex-situ low-temperature pre-epi cleaning methods
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Caymax, Matty
;
Decoutere, Stefaan
;
Röhr, Erika
;
Vandervorst, Wilfried
;
Heyns, Marc
;
Sprey, Hessel
;
Storm, Arjen
;
Maes, J.W.
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1960
since deposited on 2021-09-30
Acq. date: 2026-01-08
Citations
Metrics
Views
1960
since deposited on 2021-09-30
Acq. date: 2026-01-08
Citations