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dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorVerhulst, Anne
dc.contributor.authorWalke, Amey
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDevriendt, Katia
dc.contributor.authorLocorotondo, Sabrina
dc.contributor.authorDemand, Marc
dc.contributor.authorBryce, George
dc.contributor.authorLoo, Roger
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorVandeweyer, Tom
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T05:16:32Z
dc.date.available2021-10-22T05:16:32Z
dc.date.issued2014-12
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24454
dc.sourceIIOimport
dc.titleGe-source vertical tunnel FETs using a novel replacement-source integration scheme
dc.typeJournal article
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDevriendt, Katia
dc.contributor.imecauthorLocorotondo, Sabrina
dc.contributor.imecauthorDemand, Marc
dc.contributor.imecauthorBryce, George
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorVandeweyer, Tom
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDevriendt, Katia::0000-0002-0662-7926
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage4032
dc.source.endpage4039
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue12
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6954497
imec.availabilityPublished - imec


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