Physical modeling of NBTI: from individual defects to devices

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Authors

Rzepa, G.; Goes, W.; Rott, G.; Rott, K.; Karner, M.; Kernstock, C.; Kaczer, Ben; Reisinger, H.; Grasser, T.

Conference

International Conference on Simulation of Semiconductor Processes and Devices - SISPAD

Title

Physical modeling of NBTI: from individual defects to devices

Publication type

Proceedings paper

Collections

Conference contributions