Deep-level transient spectroscopic study of quenched-in defects in germanium

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Authors
Segers, Siegfried; Lauwaert, Johan; Clauws, Paul; Callens, Freddy; Vanhellemont, Jan; Simoen, Eddy; Vrielinck, Henk
Conference
EMRS Spring Meeting Symposium X: Materials Research for Group IV Semiconductors
Title
Deep-level transient spectroscopic study of quenched-in defects in germanium
Publication type
Oral presentation
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