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Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Publication:
Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Cretu, Bogdan
;
Fang, Wen
;
Aoulaiche, Marc
;
Routoure, Jean-Marc
;
Carin, Regis
;
Dos Santos, Sara
;
Luo, Jun
;
Zhao, Chao
;
Martino, Joao
;
Claeys, Cor
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Abstract
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1977
since deposited on 2021-10-22
468
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1977
since deposited on 2021-10-22
468
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations