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Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
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Authors
Simoen, Eddy
;
Cretu, Bogdan
;
Fang, Wen
;
Aoulaiche, Marc
;
Routoure, Jean-Marc
;
Carin, Regis
;
Dos Santos, Sara
;
Luo, Jun
;
Zhao, Chao
;
Martino, Joao
;
Claeys, Cor
Conference
E-MRS Spring Meeting Symposium H: Analytical Techniques for Precise Characterization of Nanomaterials - ALTECH
Title
Towards single-trap spectroscopy: Generation-recombination noise in UTBOX SOI nMOSFETs
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