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Low-frequency-noise-based oxide trap profiling in replacement high-k/metal gate pMOSFETs
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Authors
Simoen, Eddy
;
Lee, Jae Woo
;
Veloso, Anabela
;
Paraschiv, Vasile
;
Horiguchi, Naoto
;
Claeys, Cor
ISSN
2162-8769
Issue
6
Journal
ECS Journal of Solid State Science and Technology
Volume
3
Title
Low-frequency-noise-based oxide trap profiling in replacement high-k/metal gate pMOSFETs
Publication type
Journal article
Embargo date
9999-12-31
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