Impact of off state stress on advanced high-K metal gate NMOSFETs

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Authors
Spessot, Alessio; Aoulaiche, Marc; Cho, Moon Ju; Franco, Jacopo; Schram, Tom; Ritzenthaler, Romain; Kaczer, Ben
Conference
40th European Solid State Device Research Conference - ESSDERC
Title
Impact of off state stress on advanced high-K metal gate NMOSFETs
Publication type
Proceedings paper
Embargo date
9999-12-31
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