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XPS study of the role of Ti and TiN caps on the Cobalt/SiO2 interface
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XPS study of the role of Ti and TiN caps on the Cobalt/SiO2 interface
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Kondoh, Eiichi
;
Vandervorst, Wilfried
;
Maex, Karen
Journal
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2018
since deposited on 2021-09-30
Acq. date: 2025-12-16
Citations
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Views
2018
since deposited on 2021-09-30
Acq. date: 2025-12-16
Citations