Authors

Toledano Luque, Maria; Degraeve, Robin; Roussel, Philippe; Ragnarsson, Lars-Ake; Chiarella, Thomas; Horiguchi, Naoto; Mocuta, Anda; Thean, Aaron

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

61

Title

Fast ramped voltage characterization of single trap bias and temperature impact on time-dependent VTH variability

Publication type

Journal article