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Superior reliability of junctionless pFinFETs by reduced oxide electric field

dc.contributor.authorToledano Luque, Maria
dc.contributor.authorMatagne, Philippe
dc.contributor.authorSibaja-Hernandez, Arturo
dc.contributor.authorChiarella, Thomas
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorSoree, Bart
dc.contributor.authorCho, Moon Ju
dc.contributor.authorMocuta, Anda
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T06:35:26Z
dc.date.available2021-10-22T06:35:26Z
dc.date.issued2014
dc.identifier.issn0741-3106
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24618
dc.sourceIIOimport
dc.titleSuperior reliability of junctionless pFinFETs by reduced oxide electric field
dc.typeJournal article
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorSibaja-Hernandez, Arturo
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorSoree, Bart
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1179
dc.source.endpage1181
dc.source.journalIEEE Electron Device Letters
dc.source.issue12
dc.source.volume35
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6932422
imec.availabilityPublished - open access


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