Superior reliability of junctionless pFinFETs by reduced oxide electric field

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Authors

Toledano Luque, Maria; Matagne, Philippe; Sibaja-Hernandez, Arturo; Chiarella, Thomas; Ragnarsson, Lars-Ake; Soree, Bart; Cho, Moon Ju; Mocuta, Anda; Thean, Aaron

ISSN

0741-3106

Issue

12

Journal

IEEE Electron Device Letters

Volume

35

Title

Superior reliability of junctionless pFinFETs by reduced oxide electric field

Publication type

Journal article

Embargo date

9999-12-31

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