Publication:

Superior reliability of junctionless pFinFETs by reduced oxide electric field

Date

2014

Journal article

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Files

31170.pdf 533.9 KB

Author(s)

Toledano Luque, Maria

;

Matagne, Philippe

;

Sibaja-Hernandez, Arturo

;

Chiarella, Thomas

;

Ragnarsson, Lars-Ake

;

;

;

;

Journal

IEEE Electron Device Letters

Metrics

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Acq. date: 2025-12-16