Publication:

Superior reliability of junctionless pFinFETs by reduced oxide electric field

Date

2014

Journal article

Simple item page Full metadata Statistics

Files

31170.pdf 533.9 KB

Author(s)

Toledano Luque, Maria

;

Matagne, Philippe

;

Sibaja-Hernandez, Arturo

;

Chiarella, Thomas

;

Ragnarsson, Lars-Ake

;

;

;

;

Journal

IEEE Electron Device Letters

Statistics

1837 since deposited on 2021-10-22

1last month

1last week

Acq. date: 2026-02-24