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Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
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Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips
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Date
1998
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Criel, Steven
;
Bonjean, F.
;
De Smedt, R.
;
De Moerloose, Jan
;
Martens, Luc
;
Olyslager, Frank
;
De Zutter, Daniel
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1958
since deposited on 2021-09-30
Acq. date: 2026-01-07
Citations
Metrics
Views
1958
since deposited on 2021-09-30
Acq. date: 2026-01-07
Citations