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Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown

dc.contributor.authorCrupi, Felice
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorNigam, Tanya
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-30T11:37:22Z
dc.date.available2021-09-30T11:37:22Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2467
dc.sourceIIOimport
dc.titleCharacteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.conferenceProceedings Solid State Devices and Materials Conference; September 1998; Hiroshima, Japan.
dc.source.conferencelocation
imec.availabilityPublished - imec


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