dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Anada, S. | |
dc.contributor.author | Nagase, T. | |
dc.contributor.author | Yasuda, H. | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Vandooren, Anne | |
dc.date.accessioned | 2021-10-22T07:34:17Z | |
dc.date.available | 2021-10-22T07:34:17Z | |
dc.date.issued | 2014 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24738 | |
dc.source | IIOimport | |
dc.title | Ultra high voltage electron microscoy study of {113}-defect generation in Si nanowires | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.source.peerreview | yes | |
dc.source.beginpage | na | |
dc.source.conference | In-situ Characterization of Material Synthesis and Properties at the Nanoscale with TEM | |
dc.source.conferencedate | 21/04/2014 | |
dc.source.conferencelocation | San Francisco, CA USA | |
dc.identifier.url | http://dx.doi.org/10.1557/opl.2014.895 | |
imec.availability | Published - imec | |
imec.internalnotes | MRS Symposium Proceedings; Vol. 1713 | |