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dc.contributor.authorVerhulst, Anne
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T07:56:21Z
dc.date.available2021-10-22T07:56:21Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24779
dc.sourceIIOimport
dc.titleTunnel-FETs: n-channel versus p-channel and beyond
dc.typeProceedings paper
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.source.peerreviewno
dc.source.conferenceSematech Beyond CMOS Workshop
dc.source.conferencedate14/12/2014
dc.source.conferencelocationSan Francisco USA
imec.availabilityPublished - imec


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