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Study of GeSn strain relaxation and thermal stability in view of strain relaxed buffer layer applications

dc.contributor.authorWang, Wei
dc.contributor.authorLoo, Roger
dc.contributor.authorShimura, Yosuke
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T08:10:40Z
dc.date.available2021-10-22T08:10:40Z
dc.date.issued2014-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24805
dc.sourceIIOimport
dc.titleStudy of GeSn strain relaxation and thermal stability in view of strain relaxed buffer layer applications
dc.typeMeeting abstract
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.conferenceJSPS International Core-to-Core Program Workshop on Atomically Controlled Processing for Ultra-large Scale Integration
dc.source.conferencedate13/11/2014
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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