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TID and displacement damage resilience of 1T1R Hfo2 hf resistive memories

dc.contributor.authorWeeden-Wright, S.L.
dc.contributor.authorBennett, W.G.
dc.contributor.authorHooten, N.C.
dc.contributor.authorZhang, E.X.
dc.contributor.authorMcCurdy, M.W.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorReed, R.A.
dc.contributor.authorWeller,
dc.contributor.authorFleetwood,
dc.contributor.authorAlles, M.C.
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJurczak, Gosia
dc.contributor.authorFantini, Andrea
dc.date.accessioned2021-10-22T08:13:22Z
dc.date.available2021-10-22T08:13:22Z
dc.date.issued2014
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24810
dc.sourceIIOimport
dc.titleTID and displacement damage resilience of 1T1R Hfo2 hf resistive memories
dc.typeJournal article
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorFantini, Andrea
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage2972
dc.source.endpage2978
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue6
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6940332
imec.availabilityPublished - imec


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