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Articles
Integration aspects of strained Ge pFETs
Publication:
Integration aspects of strained Ge pFETs
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Date
2014-08
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Witters, Liesbeth
;
Eneman, Geert
;
Mitard, Jerome
;
Vincent, Benjamin
;
Loo, Roger
;
Hikavyy, Andriy
;
Milenin, Alexey
;
Mertens, Sofie
;
Thean, Aaron
;
Collaert, Nadine
Journal
Solid-State Electronics
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1844
since deposited on 2021-10-22
Acq. date: 2025-12-16
Citations
Metrics
Views
1844
since deposited on 2021-10-22
Acq. date: 2025-12-16
Citations