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Challenges in BEOL cleaning for the 10 nm node and beyond
Publication:
Challenges in BEOL cleaning for the 10 nm node and beyond
Date
2014
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yu, David
;
Le, Quoc Toan
;
Braun, Simon
;
Kesters, Els
;
Shen, Mary
;
Klipp, Andreas
;
Holsteyns, Frank
Journal
Abstract
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1918
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations