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Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory

dc.contributor.authorZahid, Mohammed
dc.contributor.authorDegraeve, Robin
dc.contributor.authorTang, Baojun
dc.contributor.authorLisoni, Judit
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorVan Houdt, Jan
dc.contributor.authorBreuil, Laurent
dc.contributor.authorBlomme, Pieter
dc.contributor.authorArreghini, Antonio
dc.date.accessioned2021-10-22T08:49:55Z
dc.date.available2021-10-22T08:49:55Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24876
dc.sourceIIOimport
dc.titleDefects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.source.peerreviewyes
dc.source.beginpage2E-3.1
dc.source.endpage2E-3.5
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6860601&contentType=Conference+Publications
imec.availabilityPublished - imec


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