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High-drive current (>1MA/cm2), highly nonlinear (>103) TiN/amorphous-silicon/TiN scalable bidirectional selector with excellent reliability and its variability impact on the 1S1R array performance

dc.contributor.authorZhang, Leqi
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorCrotti, Davide
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorClima, Sergiu
dc.contributor.authorChen, Yangyin
dc.contributor.authorOpsomer, Karl
dc.contributor.authorSubhechha, Subhali
dc.contributor.authorWouters, Dirk
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorCosemans, Stefan
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorHendrickx, Paul
dc.contributor.authorWitters, Thomas
dc.contributor.authorHody, Hubert
dc.contributor.authorParaschiv, Vasile
dc.contributor.authorRadu, Iuliana
dc.date.accessioned2021-10-22T08:55:43Z
dc.date.available2021-10-22T08:55:43Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24886
dc.sourceIIOimport
dc.titleHigh-drive current (>1MA/cm2), highly nonlinear (>103) TiN/amorphous-silicon/TiN scalable bidirectional selector with excellent reliability and its variability impact on the 1S1R array performance
dc.typeProceedings paper
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorHendrickx, Paul
dc.contributor.imecauthorWitters, Thomas
dc.contributor.imecauthorHody, Hubert
dc.contributor.imecauthorParaschiv, Vasile
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage164
dc.source.endpage167
dc.source.conferenceInternational Electronic Device Meeting - IEDM
dc.source.conferencedate15/12/2014
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


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