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Comparative analysis of RD and atomistic trap-based BTI models on SRAM sense amplifier

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorCosemans, Stefan
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-22T18:29:57Z
dc.date.available2021-10-22T18:29:57Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24920
dc.sourceIIOimport
dc.titleComparative analysis of RD and atomistic trap-based BTI models on SRAM sense amplifier
dc.typeProceedings paper
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conference10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - DTIS
dc.source.conferencedate1/03/2015
dc.source.conferencelocationNapoli Italy
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7127371
imec.availabilityPublished - open access


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