dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Cott, Daire | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Vanherle, Wendy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Favia, Paola | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Meersschaut, Johan | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Mertens, Hans | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Mocuta, Anda | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-22T18:30:33Z | |
dc.date.available | 2021-10-22T18:30:33Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24939 | |
dc.source | IIOimport | |
dc.title | Ge nFET with high electron mobility and superior PBTI reliability enabled by monolayer-Si surface passivation and La-induced interface dipole formation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Cott, Daire | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Vanherle, Wendy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Favia, Paola | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Meersschaut, Johan | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Mertens, Hans | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Favia, Paola::0000-0002-1019-3497 | |
dc.contributor.orcidimec | Meersschaut, Johan::0000-0003-2467-1784 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 588 | |
dc.source.endpage | 591 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 7/12/2015 | |
dc.source.conferencelocation | Washington, D.C. USA | |
imec.availability | Published - imec | |