dc.contributor.author | Baert, Rogier | |
dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Vega Gonzalez, Victor | |
dc.contributor.author | Boemmels, Juergen | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Ryckaert, Julien | |
dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Verkest, Diederik | |
dc.date.accessioned | 2021-10-22T18:31:01Z | |
dc.date.available | 2021-10-22T18:31:01Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24951 | |
dc.source | IIOimport | |
dc.title | Variability of quadruple-patterning interconnect processes | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Baert, Rogier | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Vega Gonzalez, Victor | |
dc.contributor.imecauthor | Boemmels, Juergen | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 135 | |
dc.source.endpage | 138 | |
dc.source.conference | IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM | |
dc.source.conferencedate | 18/05/2015 | |
dc.source.conferencelocation | Grenoble France | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7325645 | |
imec.availability | Published - imec | |