Show simple item record

Plan-view specimen preparation of device structures with FIB

dc.contributor.authorBender, Hugo
dc.contributor.authorVan Marcke, Patricia
dc.contributor.authorRichard, Olivier
dc.contributor.authorFavia, Paola
dc.date.accessioned2021-10-22T18:32:51Z
dc.date.available2021-10-22T18:32:51Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24985
dc.sourceIIOimport
dc.titlePlan-view specimen preparation of device structures with FIB
dc.typeOral presentation
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVan Marcke, Patricia
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorFavia, Paola
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.source.peerreviewno
dc.source.conferenceESREF European FIB Uuser Group Workshop - EFUG
dc.source.conferencedate8/10/2015
dc.source.conferencelocationToulouse France
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record