Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Inspection, characterization and classification of defects for improved CMP of III-V materials
Publication:
Inspection, characterization and classification of defects for improved CMP of III-V materials
Date
2015
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bhonsle, Rithu
;
Teugels, Lieve
;
Usman Ibrahim, Ansar
;
Ong, Patrick
;
Delande, Tinne
;
Krishnan, S
;
Siebert, Max
;
Struyf, Herbert
;
Leunissen, Leonardus
Journal
ECS Journal of Solid State Science and Technology
Abstract
Description
Metrics
Views
1934
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations
Metrics
Views
1934
since deposited on 2021-10-22
Acq. date: 2025-10-25
Citations