dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Vermeire, Bert | |
dc.contributor.author | Depas, Michel | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Gräf, D. | |
dc.date.accessioned | 2021-09-29T12:43:39Z | |
dc.date.available | 2021-09-29T12:43:39Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/249 | |
dc.source | IIOimport | |
dc.title | Statistical analysis of gate oxide integrity test | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 350 | |
dc.source.conference | Proceedings of the Institute of Environmental Science: 40th Annual Technical Meeting | |
dc.source.conferencedate | 01/05/1994 | |
dc.source.conferencelocation | Chicago, IL USA | |
imec.availability | Published - open access | |