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ESD characterization of germanium FinFET diodes and ggMOS

dc.contributor.authorBoschke, Roman
dc.contributor.authorLinten, Dimitri
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorScholz, Mirko
dc.contributor.authorHellings, Geert
dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T18:34:31Z
dc.date.available2021-10-22T18:34:31Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25008
dc.sourceIIOimport
dc.titleESD characterization of germanium FinFET diodes and ggMOS
dc.typeMeeting abstract
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.source.peerreviewyes
dc.source.conferenceEOS/ESD Symposium
dc.source.conferencedate27/09/2015
dc.source.conferencelocationReno, NV USA
imec.availabilityPublished - imec


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