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Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

dc.contributor.authorChen, Michael
dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorClima, Sergiu
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorChen, Yangyin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-22T18:40:12Z
dc.date.available2021-10-22T18:40:12Z
dc.date.issued2015
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25064
dc.sourceIIOimport
dc.titleEndurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.source.peerreviewyes
dc.source.beginpage53501
dc.source.journalApplied Physics Letters
dc.source.issue5
dc.source.volume106
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/106/5/10.1063/1.4907573
imec.availabilityPublished - imec


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