Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

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Authors

Chen, Michael; Goux, Ludovic; Fantini, Andrea; Clima, Sergiu; Degraeve, Robin; Redolfi, Augusto; Chen, Yangyin; Groeseneken, Guido; Jurczak, Gosia

ISSN

0003-6951

Issue

5

Journal

Applied Physics Letters

Volume

106

Title

Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

Publication type

Journal article

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