Publication:

Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

Date

2015
Journal article
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dc.contributor.authorChen, Michael
dc.contributor.authorGoux, Ludovic
dc.contributor.authorFantini, Andrea
dc.contributor.authorClima, Sergiu
dc.contributor.authorDegraeve, Robin
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorChen, Yangyin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorChen, Yangyin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-22T18:40:12Z
dc.date.available2021-10-22T18:40:12Z
dc.date.issued2015
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25064
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/106/5/10.1063/1.4907573
dc.source.beginpage53501
dc.source.issue5
dc.source.journalApplied Physics Letters
dc.source.volume106
dc.title

Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

dc.typeJournal article
dspace.entity.typePublication
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