Endurance failure mechanisms in TiN\Ta2O5\Ta RRAM stack

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Author(s)

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Fantini, Andrea

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Degraeve, Robin

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Redolfi, Augusto

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Groeseneken, Guido

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Journal

Applied Physics Letters

Metrics

1879 since deposited on 2021-10-22

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Acq. date: 2025-10-24