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On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires

dc.contributor.authorCho, Moon Ju
dc.contributor.authorHellings, Geert
dc.contributor.authorVeloso, Anabela
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoussel, Philippe
dc.contributor.authorKaczer, Ben
dc.contributor.authorArimura, Hiroaki
dc.contributor.authorFang, W
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMatagne, Philippe
dc.contributor.authorCollaert, Nadine
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-22T18:41:49Z
dc.date.available2021-10-22T18:41:49Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25078
dc.sourceIIOimport
dc.titleOn and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires
dc.typeProceedings paper
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorArimura, Hiroaki
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.beginpage366
dc.source.endpage369
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2015
dc.source.conferencelocationWashington, D.C. USA
dc.identifier.url\nt3\sherlock\proceedings\IEDM\IEDM2015\DATA\S14P05.PDF
imec.availabilityPublished - imec


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