dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Fang, W | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-22T18:41:49Z | |
dc.date.available | 2021-10-22T18:41:49Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25078 | |
dc.source | IIOimport | |
dc.title | On and off state Hot Carrier reliability in Junctionless high-K MG gate-all-around nanowires | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 366 | |
dc.source.endpage | 369 | |
dc.source.conference | IEEE International Electron Devices Meeting - IEDM | |
dc.source.conferencedate | 7/12/2015 | |
dc.source.conferencelocation | Washington, D.C. USA | |
dc.identifier.url | \nt3\sherlock\proceedings\IEDM\IEDM2015\DATA\S14P05.PDF | |
imec.availability | Published - imec | |