dc.contributor.author | Cho, Moon Ju | |
dc.contributor.author | Spessot, Alessio | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Aoulaiche, Marc | |
dc.contributor.author | Ritzenthaler, Romain | |
dc.contributor.author | Schram, Tom | |
dc.contributor.author | Fazan, Pierre | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Linten, Dimitri | |
dc.date.accessioned | 2021-10-22T18:41:57Z | |
dc.date.available | 2021-10-22T18:41:57Z | |
dc.date.issued | 2015-06 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/25079 | |
dc.source | IIOimport | |
dc.title | Off-state stress degradation mechanism on advanced p-MOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Spessot, Alessio | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Ritzenthaler, Romain | |
dc.contributor.imecauthor | Schram, Tom | |
dc.contributor.imecauthor | Fazan, Pierre | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
dc.contributor.orcidimec | Schram, Tom::0000-0003-1533-7055 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 1 | |
dc.source.endpage | 4 | |
dc.source.conference | International Conference on IC Design and Technology - ICICDT | |
dc.source.conferencedate | 1/06/2015 | |
dc.source.conferencelocation | Leuven Belgium | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7165893 | |
imec.availability | Published - imec | |