Show simple item record

Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs

dc.contributor.authorCretu, B.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRoutoure, J.M.
dc.contributor.authorCarin, R.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-22T18:46:11Z
dc.date.available2021-10-22T18:46:11Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25110
dc.sourceIIOimport
dc.titleStatic and low frequency noise characterization in standard and rotated UTBOX nMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage237
dc.source.endpage240
dc.source.conferenceJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate26/01/2015
dc.source.conferencelocationBologna Italy
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063817
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
33446.pdf
Size:
399.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record